Device for wafer mapping
Optional add-on for exploring and mapping crystal orientation or surface distortions.
Determine the full crystal orientation precisely in seconds using our proprietary scan method. DDCOM is efficient with low energy consumption and operating costs – making it ideal for both research and industry applications alike.
Download brochureUltra-fast, precise (up to (1/100)o crystal orientation at your fingertips. DDCOM acquires reliable results more than 100 times faster than the traditional methods with additional time savings due to the top down-measurement geometry. This highly versatility instrument utilizes an air-cooled X-ray tube and portable design to ensure lower running costs and maximum convenience, ideal for quality control, marking, and research applications.
Our proprietary scan method requires only one scan rotation to gather all the necessary data for crystal orientation determination, delivering precise results in the range of a few seconds (single rotation).
The material-specific instrument geometry enables the orientation of the crystal lattice to be measured in relation to the rotation axis ultra-fast with precision increasing with the number of scan rotations.
The compact design of DDCOM allows the system to fit into any setting. The software is both powerful and intuitive, making it convenient and easy to operate for a range of users.
Maintain control of cutting, grinding, and lapping processes with high precision up to 1/100o. DDCOM delivers complete lattice orientation of single crystals and is designed for the azimuthal setting and marking of crystal orientation.
Pre-programmed crystal parameters enable the determination of arbitrary unknown orientation of various structures, and aids in refining the workflow for greater efficiency. Various stage accessories enable metrology in different process steps.
DDCOM is well-equipped for both research and production environments in which a range of sample types need to be analyzed. Operating costs are low for the DDCOM, thanks to its low energy consumption and air-cooled X-ray tube – no water cooling is required.
The instrument can measure a range of different materials with varying structures making it a versatile addition to any laboratory. Some examples of measurable materials include:
Technical specification | |
---|---|
X-ray source | 30 W air-cooled X-ray tube, Cu anode |
Detectors | Two scintillation counters |
Sample holder | Precise turntable, setting accuracy 0.01°, tools for defined sample positioning and marking |
Physical specification | |
Dimensions | 600 mm × 600 mm × 850 mm |
Weight | 80 kg |
Power supply | 100-230 V, 500 W, single phase |
Room temperature | ≤ 30° C |
Configuration options | |
Device for mapping of wafers (maximum diameter 225 mm) | |
Device for automatic loading from cassettes | |
Examples of measurable materials | |
Cubic / arbitrary unknown orientation: Si, Ge, GaAs, GaP, AlAs, AlP, InP, NaCl, AgCl, CaF2 | |
Cubic / special orientation: Ag, Au, Ni, Pt, GaSb, InAs, InSb, AlSb, ZnTe, CdTe, SiC 3C, PbS, PbTe, SnTe, MgO, LiF, MgAl2O4, SrTiO3, LaTiO3 | |
Tetragonal: MgF2, TiO2, SrLaAlO4 | |
Hexagonal / Trigonal: SiC 2H, 4H, 6H, 15R, GaN, ZnO, LiNbO3, SiO2 (quartz), Al2O3 (sapphire), GaPO4, La3Ga5SiO14 | |
Orthorhombic: Mg2SiO4, NdGaO3 | |
Further materials according to the customers’ demands |
Optional add-on for exploring and mapping crystal orientation or surface distortions.
An extra tool to enable automated loading of samples from a cassette, improving throughput time and workflow efficiency.
Get versatile, ultra-fast crystal orientation measurements with the power of automation – all in a lightweight and cost-effective desktop instrument.